Rigaku Electron Diffraction
Model type
Manufacturer
Rigaku
Specification
・Enables Structure Analysis of Nano-Sized Crystals
It possible to determine the structures of extremely small crystals—ranging from tens to hundreds of nanometers. It opens new possibilities for analyzing samples that were previously too small for conventional X-ray diffraction.
・Fast, Seamless Workflow
From sample selection to diffraction data collection and structure analysis, the entire process is streamlined using Software. This enables efficient and rapid structure determination with minimal manual intervention.
・ Intuitive Operation—No Expertise Required
Even researchers with no prior electron microscopy experience can use from day one, as long as they have some background in single-crystal X-ray analysis. It allows straightforward access to 3D Electron Diffraction (3DED / MicroED) techniques.
It possible to determine the structures of extremely small crystals—ranging from tens to hundreds of nanometers. It opens new possibilities for analyzing samples that were previously too small for conventional X-ray diffraction.
・Fast, Seamless Workflow
From sample selection to diffraction data collection and structure analysis, the entire process is streamlined using Software. This enables efficient and rapid structure determination with minimal manual intervention.
・ Intuitive Operation—No Expertise Required
Even researchers with no prior electron microscopy experience can use from day one, as long as they have some background in single-crystal X-ray analysis. It allows straightforward access to 3D Electron Diffraction (3DED / MicroED) techniques.
Location
iCeMS Main Building A103
Installation Year
2024
Rigaku Electron Diffraction
iCeMS
27 iCeMS Main Building A103
地図を閉じる
Overview
・TEM (JEOL) and SCXRD (Rigaku) are combined in one
・Available particle size ranges in several 10 nm ~ up to 1,000 nm (1µm),
~×100 smaller than single crystals used in XRD
・Seamless switch of the image acquisition modes, fast measurement:
One set of diffraction data collection takes several minutes ~ 30min
・Available particle size ranges in several 10 nm ~ up to 1,000 nm (1µm),
~×100 smaller than single crystals used in XRD
・Seamless switch of the image acquisition modes, fast measurement:
One set of diffraction data collection takes several minutes ~ 30min
Responsible department
Institute for Integrated Cell-Material Sciences (iCeMS)
Available Users
Kyoto University(If this is your first time, please contact us in advance.)Other Research Institutes,Companies, etc.
Notes
iCeMS Getting Started
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
Usage rules
Inquiries
Institute for Integrated Cell-Material Sciences（iCeMS）
info_ac [at] icems.kyoto-u.ac.jp (please change [at] to ＊)
※Please change 「*」 to 「@」 and send.
info_ac [at] icems.kyoto-u.ac.jp (please change [at] to ＊)
※Please change 「*」 to 「@」 and send.