Schottky Scanning Electron Microscope SU5000
Model type
SU5000
Manufacturer
Hitachi
Specification
・Shape observation and composition analysis at the nano- to micro-scale
・resolution 1.2 nm(30kV), 3.0 nm(1kV)
・acc. voltage 0.5 kV~30 kV
・magnification x 25 ~ x 600,000
・Energy Dispersive X-ray Spectrometer（EDS）、large area observation
・resolution 1.2 nm(30kV), 3.0 nm(1kV)
・acc. voltage 0.5 kV~30 kV
・magnification x 25 ~ x 600,000
・Energy Dispersive X-ray Spectrometer（EDS）、large area observation
Location
iCeMS Research Building
Installation Year
2014
Schottky Scanning Electron Microscope SU5000
iCeMS
27 iCeMS Research Building
地図を閉じる
Overview
・Shape observation and composition analysis at the nano- to micro-scale
・resolution 1.2 nm(30kV), 3.0 nm(1kV)
・acc. voltage 0.5 kV~30 kV
・magnification x 25 ~ x 600,000
・Energy Dispersive X-ray Spectrometer（EDS）、large area observation
・resolution 1.2 nm(30kV), 3.0 nm(1kV)
・acc. voltage 0.5 kV~30 kV
・magnification x 25 ~ x 600,000
・Energy Dispersive X-ray Spectrometer（EDS）、large area observation
Responsible department
Institute for Integrated Cell-Material Sciences (iCeMS)
Available Users
Kyoto University(If this is your first time, please contact us in advance.)Other Research Institutes,Companies, etc.
Notes
iCeMS Getting Started
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
Usage rules
Inquiries
Institute for Integrated Cell-Material Sciences（iCeMS）
info_ac＊icems.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.
info_ac＊icems.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.