JEOL Field Emission Scanning Electron Misroscope（FE-SEM） JSM-75FTC
Model type
JSM-7500F
Manufacturer
JEOL（日本電子）
Specification
・Shape observation and composition analysis at the nano- micro-scale
・resolution 1.0nm(15kV), 1.4nm(1kV)
・acc. voltage 0.1kV~30kV
・magnification x25~x1,000,000
・Method low acceleration voltage mode (Gentlebeam), Energy filter(ganma-filter)
・resolution 1.0nm(15kV), 1.4nm(1kV)
・acc. voltage 0.1kV~30kV
・magnification x25~x1,000,000
・Method low acceleration voltage mode (Gentlebeam), Energy filter(ganma-filter)
Location
Installation Year
2008
JEOL Field Emission Scanning Electron Misroscope（FE-SEM） JSM-75FTC
iCeMS
27
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Overview
・Shape observation and composition analysis at the nano- micro-scale
・resolution 1.0nm(15kV), 1.4nm(1kV)
・acc. voltage 0.1kV~30kV
・magnification x25~x1,000,000
・Method low acceleration voltage mode (Gentlebeam), Energy filter(ganma-filter)
・resolution 1.0nm(15kV), 1.4nm(1kV)
・acc. voltage 0.1kV~30kV
・magnification x25~x1,000,000
・Method low acceleration voltage mode (Gentlebeam), Energy filter(ganma-filter)
Responsible department
Institute for Integrated Cell-Material Sciences (iCeMS)
Available Users
Kyoto University(If this is your first time, please contact us in advance.)Other Research Institutes,Companies, etc.
Notes
iCeMS Getting Started
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
Usage rules
Inquiries
Institute for Integrated Cell-Material Sciences（iCeMS）
info_ac＊icems.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.
info_ac＊icems.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.