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JEOL Field Emission Transmission Electron Microscope（FE-TEM） JEM-2200FS

Model type
JEM-2200FS+JED-2300T
Manufacturer
JEOL（日本電子）
Specification
・local state analysis such as morphological observation and
structural analysis in nano-scale
・Elemental analysis for the nano regions by EDX
・High-contrast observation with an omega-type energy filter
・Low temperature, high temperature sample holder
・resolution lattice 0.05nm, point 0.14nm @200kV
・TEM(BF,DF), SAED, STEM(BF,HAADF), EDX(point, line, mapping), EELS
Location
Installation Year
2009
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JEOL Field Emission Transmission Electron Microscope（FE-TEM） JEM-2200FS
iCeMS
27
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Overview
・local state analysis such as morphological observation and
structural analysis in nano-scale
・Elemental analysis for the nano regions by EDX
・High-contrast observation with an omega-type energy filter
・Low temperature, high temperature sample holder
・resolution lattice 0.05nm, point 0.14nm @200kV
・TEM(BF,DF), SAED, STEM(BF,HAADF), EDX(point, line, mapping), EELS
Responsible department
Institute for Integrated Cell-Material Sciences (iCeMS)
Available Users
Kyoto University(If this is your first time, please contact us in advance.)Other Research Institutes,Companies, etc.
Notes
iCeMS Getting Started
https://www.analysis.icems.kyoto-u.ac.jp/user-registration-procedures/
Usage rules
Usage rules https://www.analysis.icems.kyoto-u.ac.jp/documents/
Inquiries
Institute for Integrated Cell-Material Sciences（iCeMS）
info_ac＊icems.kyoto-u.ac.jp
※Please change 「*」 to 「@」 and send.
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